Rupich M.W., Aytug T., Leonard K.J., Zhang Y., Gapud A.A., Khan A., III F.A., Greenwood N.T., Alexander J.A.
Aytug T., Christen D.K., Paranthaman M.P., Leonard K.J., Thompson J.R., Xiong X., Selvamanickam V., Wee S.H., Zuev Y.L., Polat O., Sinclair J.W., Ertugrul M.
Miller D.J., Maroni V.A., Specht E.D., Chen Z., Aytug T., Paranthaman M.P., Zuev Y., Kropf A.J., Zaluzec N.J.
Miller D.J., Maroni V.A., Specht E.D., Paranthaman M., Aytug T., Cantoni C., Zhang Y., Zuev Y., Kropf A.J., Chen Z.*21, Zaluzec N.
Paranthaman M., Aytug T., Christen D.K., Thompson J.R., Kim K., Selvamanickam V., Polat O., Qiu X., Lupini A.R., Meyer H.M.
Ключевые слова: presentation, HTS, YBCO, coated conductors, IBAD process, MOCVD process, commercialization, long conductors, fabrication, roughness, planarization, texture, substrate Hastelloy, microstructure, irradiation effects, growth rate, defects, pinning, critical caracteristics, critical current density, angular dependence, Jc/B curves, nanoscaled effects, nanodots, phase composition, defects columnar, homogeneity, critical current, thickness dependence
Maroni V.A., Goyal A., Specht E.D., Paranthaman M., Aytug T., Christen D.K., Kim K., Cantoni C., Zhang Y., Selvamanickam V., Chen Y., Zuev Y.L.
Maroni V.A., Goyal A., Paranthaman M., Aytug T., Heatherly L., Kim K., Zhang Y., Selvamanickam V., Chen Y., Zuev Y.
Ключевые слова: HTS, YBCO, coated conductors, MOCVD process, IBAD process, fabrication
Ключевые слова: HTS, YBCO, coated conductors, MOCVD process, IBAD process, fabrication, buffer layers, critical caracteristics, doping effect, pilot-scale, presentation
Ключевые слова: presentation, HTS, YBCO, coated conductors, fabrication, MOCVD process, IBAD process, buffer layers, substrate Hastelloy, roughness, critical caracteristics, Jc/B curves, angular dependence, doping effect, microstructure, long conductors, coils pancake, critical current, pilot-scale, homogeneity
Ключевые слова: patents, chemical solution deposition, fabrication, template layers, texture, HTS, coated conductors, YBCO
Goyal A., Paranthaman M., Lee D., Aytug T., Cantoni C., Zhang Y., Selvamanickam V., Chen Y., Zuev Y., Specht E.
Goyal A., Specht E.D., Aytug T., Christen D.K., Paranthaman M.P., Thompson J.R., Cantoni C., Zhang Y., Selvamanickam V., Chen Y., Zuev Y.L., Sinclair J.W.
Ключевые слова: cryogenic systems, dielectrics, breakdown characteristics, experimental results
Ключевые слова: patents, HTS, coated conductors, buffer layers, fabrication, YBCO, substrate Ni-W, Jc/B curves, critical caracteristics
Ключевые слова: HTS, YBCO, coated conductors, MOCVD process, IBAD process, buffer layers, nanoscaled effects, template layers, long conductors, capacity, fabrication, microstructure, Jc/B curves, doping effect, REBCO, angular dependence, pinning force, texture, current-voltage characteristics, critical current, homogeneity, thickness dependence, presentation, critical caracteristics
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